स्कैनिंग इलेक्ट्रॉन माइक्रोस्कोप (पीसी-एसईएम)

Jeol JSM-6490 Bruker XFlash Detektor

Here we offer you a Jeol scanning electron microscope.

Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)

Modern, high-resolution, digital scanning electron microscope
with newly developed electron optics and intuitive,
graphical user interface (GUI) under Microsoft WindowsXP Professional.

Magnification range: 5 X - 300,000 X
Accelerating voltage 0.3 - 30 kV
Tungsten hairpin cathode (LaB6 cathode optional)
large fully motorized sample stage with eucentric
tilting, incl.
Graphic navigation on the sample holder
Easy sample navigation by click center zoom
Image field controlled navigation via 2 navigators
Relative coordinate navigation
Saving and restarting of specimen positions
Adjustable blldschnittswelses movement of the specimen stage
Field correction during rotation via computer-controlled eucentric
eccentric rotation
Image field correction during tilting via computer-controlled
controlled eucentric tilting
Calculation of the possible tilt angle on the basis of the
sample geometry
automatic focus tracking when moving the specimen in
specimen in Z-axis
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Intelligent limit switches for the motorized axes

Travel of specimen stage:
x=125mm
Y=100mm
z= 5 to 80 mm (continuous)
T= -10°C to+ 90°C
R= 360°C (endless)
Secondary electron detector for high vacuum operation
Novel, superconical objective lens guarantees high image resolution
image resolution even at large tilt angles
Guaranteed resolution In SE image: 3 nm at 30 kV and
15 nm at 1 kV
Simultaneous live image display of multiple detectors
Easy sample navigation through Cllck Center Zoom
Powerful image measurement functions
Movie function for recording dynamic processes
Versatile sample chamber with numerous
free flanges, e.g. for EDX, WDX,
EBSD, cathodoluminescence etc.
Low-maintenance and low-wear, quiet pump system
consisting of backing pump, vibration-free high-likelihood diffusion pump
and electromagnetic valve control
Extensive fault protection against faulty operation
and failure of external media
Ergonomic, height-adjustable system table
SEM starter kit consisting of 2 specimen holders,
tool set and 6 spare cathodes

Additional equipment

2x ΜΡ-43100 (TMP)

Turbomolecular pump
instead of the standard diffusion pump
When a turbomolecular pump is used, cooling water is no longer
operation of the SEM, cooling water is no longer required.

Further equipment:

PC for control of the SEM
incl. TFT monitor

ΟΧ200 Bruker Quantax 200 EDX system EXTENDED

Nitrogen-free, energy dispersive X-ray analysis system.
incl:

SDD detector with 127 eV or better energy resolution.
Detection of all elements from boron upwards
Vibration free, maintenance free. Peltier cooled (nitrogen free)
Pulse processor
TFT monitor
Spectra measurement and elemental diflcultation
Fully automatic, quantitative, standard-free
elemental analysis
Image acquisition
Superfast qualitative LIneScan
Superfast qualitative element mapping
Data management and archiving system
Report generation and results output
Data communication
Installation and training
HyperMap
Multipoint analysis

Bruker xFlash Detector (SDD) with Signal Processing Unit SVE III

Type: Jeol JSM-6490

Scope of delivery: (See photos)

Condition: used / used

(Changes and errors in the technical data, specifications are reserved!)
Further questions we can answer for you on the phone.

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